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Monitored Tomographic Reconstruction—An Advanced Tool to Study the 3D Morphology of Nanomaterials
Detailed and accurate three-dimensional (3D) information about the morphology of hierarchically structured materials is derived from multi-scale X-ray computed tomography (XCT) and subsequent 3D data reconstruction. High-resolution X-ray microscopy and nano-XCT are suitable techniques to nondestruct...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8538887/ https://www.ncbi.nlm.nih.gov/pubmed/34684965 http://dx.doi.org/10.3390/nano11102524 |