A Fault Diagnosis Method of Modular Analog Circuit Based on SVDD and D–S Evidence Theory

In the actual fault diagnosis process of an analog circuit, there is often a problem due to the lack of fault samples, leading to the low-accuracy of diagnostic models. Therefore, using positive samples that are easy to obtain to establish diagnostic models became a research hotspot in the field of...

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Detalles Bibliográficos
Autores principales: Sun, Peng, Yang, Zhiming, Jiang, Yueming, Jia, Shaohua, Peng, Xiyuan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8539104/
https://www.ncbi.nlm.nih.gov/pubmed/34696102
http://dx.doi.org/10.3390/s21206889

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8539104/
https://www.ncbi.nlm.nih.gov/pubmed/34696102
http://dx.doi.org/10.3390/s21206889

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