Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering

Scanning transmission electron microscopy (STEM) is suitable for visualizing the inside of a relatively thick specimen than the conventional transmission electron microscopy, whose resolution is limited by the chromatic aberration of image forming lenses, and thus, the STEM mode has been employed fr...

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Detalles Bibliográficos
Autores principales: Zhao, Yifang, Koike, Suguru, Nakama, Rikuto, Ihara, Shiro, Mitsuhara, Masatoshi, Murayama, Mitsuhiro, Hata, Satoshi, Saito, Hikaru
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8548491/
https://www.ncbi.nlm.nih.gov/pubmed/34702955
http://dx.doi.org/10.1038/s41598-021-99914-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8548491/
https://www.ncbi.nlm.nih.gov/pubmed/34702955
http://dx.doi.org/10.1038/s41598-021-99914-5

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