Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset

[Image: see text] Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been successfully applied for chemical imaging of overlapping fingermarks. The resulting big dataset has been treated by means of an unsupervised machine learning approach based on uniform manifold approximation and proj...

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Detalles Bibliográficos
Autores principales: Tuccitto, Nunzio, Bombace, Alessandra, Auditore, Alessandro, Valenti, Andrea, Torrisi, Alberto, Capizzi, Giacomo, Licciardello, Antonino
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2021
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8552212/
https://www.ncbi.nlm.nih.gov/pubmed/34645262
http://dx.doi.org/10.1021/acs.analchem.1c01981

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8552212/
https://www.ncbi.nlm.nih.gov/pubmed/34645262
http://dx.doi.org/10.1021/acs.analchem.1c01981

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