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Robotic fabrication of high-quality lamellae for aberration-corrected transmission electron microscopy
Aberration-corrected scanning transmission electron microscopy (STEM) is widely used for atomic-level imaging of materials but severely requires damage-free and thin samples (lamellae). So far, the preparation of the high-quality lamella from a bulk largely depends on manual processes by a skilled o...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8566590/ https://www.ncbi.nlm.nih.gov/pubmed/34732755 http://dx.doi.org/10.1038/s41598-021-00595-x |