Robotic fabrication of high-quality lamellae for aberration-corrected transmission electron microscopy

Aberration-corrected scanning transmission electron microscopy (STEM) is widely used for atomic-level imaging of materials but severely requires damage-free and thin samples (lamellae). So far, the preparation of the high-quality lamella from a bulk largely depends on manual processes by a skilled o...

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Detalles Bibliográficos
Autores principales: Tsurusawa, Hideyo, Nakanishi, Nobuto, Kawano, Kayoko, Chen, Yiqiang, Dutka, Mikhail, Van Leer, Brandon, Mizoguchi, Teruyasu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8566590/
https://www.ncbi.nlm.nih.gov/pubmed/34732755
http://dx.doi.org/10.1038/s41598-021-00595-x

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8566590/
https://www.ncbi.nlm.nih.gov/pubmed/34732755
http://dx.doi.org/10.1038/s41598-021-00595-x

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