Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was applied to detect traces of amphetamine on fingerprints. In the present study, three different lift tapes and latent powder fingerprints were tested. The obtained results show that it is possible to identify traces of a drug as well as it...

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Detalles Bibliográficos
Autores principales: Szynkowska-Jóźwik, Małgorzata I., Maćkiewicz, Elżbieta, Rogowski, Jacek, Gajek, Magdalena, Pawlaczyk, Aleksandra, de Puit, Marcel, Parczewski, Andrzej
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8584599/
https://www.ncbi.nlm.nih.gov/pubmed/34771767
http://dx.doi.org/10.3390/ma14216243

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8584599/
https://www.ncbi.nlm.nih.gov/pubmed/34771767
http://dx.doi.org/10.3390/ma14216243

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