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Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was applied to detect traces of amphetamine on fingerprints. In the present study, three different lift tapes and latent powder fingerprints were tested. The obtained results show that it is possible to identify traces of a drug as well as it...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8584599/ https://www.ncbi.nlm.nih.gov/pubmed/34771767 http://dx.doi.org/10.3390/ma14216243 |