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Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition
We report a method of growing a boron-doped diamond film by plasma-assisted chemical vapour deposition utilizing a pre-treatment of GaN substrate to give a high density of nucleation. CVD diamond was deposited on GaN substrate grown epitaxially via the molecular-beam epitaxy process. To obtain a con...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8585340/ https://www.ncbi.nlm.nih.gov/pubmed/34771852 http://dx.doi.org/10.3390/ma14216328 |
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author | Sobaszek, Michał Gnyba, Marcin Kulesza, Sławomir Bramowicz, Mirosław Klimczuk, Tomasz Bogdanowicz, Robert |
author_facet | Sobaszek, Michał Gnyba, Marcin Kulesza, Sławomir Bramowicz, Mirosław Klimczuk, Tomasz Bogdanowicz, Robert |
author_sort | Sobaszek, Michał |
collection | PubMed |
description | We report a method of growing a boron-doped diamond film by plasma-assisted chemical vapour deposition utilizing a pre-treatment of GaN substrate to give a high density of nucleation. CVD diamond was deposited on GaN substrate grown epitaxially via the molecular-beam epitaxy process. To obtain a continuous diamond film with the presence of well-developed grains, the GaN substrates are exposed to hydrogen plasma prior to deposition. The diamond/GaN heterojunction was deposited in methane ratio, chamber pressure, temperature, and microwave power at 1%, 50 Torr, 500 °C, and 1100 W, respectively. Two samples with different doping were prepared 2000 ppm and 7000 [B/C] in the gas phase. SEM and AFM analyses revealed the presence of well-developed grains with an average size of 100 nm. The epitaxial GaN substrate-induced preferential formation of (111)-facetted diamond was revealed by AFM and XRD. After the deposition process, the signal of the GaN substrate is still visible in Raman spectroscopy (showing three main GaN bands located at 565, 640 and 735 cm(−1)) as well as in typical XRD patterns. Analysis of the current–voltage characteristics as a function of temperature yielded activation energy equal to 93.8 meV. |
format | Online Article Text |
id | pubmed-8585340 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-85853402021-11-12 Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition Sobaszek, Michał Gnyba, Marcin Kulesza, Sławomir Bramowicz, Mirosław Klimczuk, Tomasz Bogdanowicz, Robert Materials (Basel) Article We report a method of growing a boron-doped diamond film by plasma-assisted chemical vapour deposition utilizing a pre-treatment of GaN substrate to give a high density of nucleation. CVD diamond was deposited on GaN substrate grown epitaxially via the molecular-beam epitaxy process. To obtain a continuous diamond film with the presence of well-developed grains, the GaN substrates are exposed to hydrogen plasma prior to deposition. The diamond/GaN heterojunction was deposited in methane ratio, chamber pressure, temperature, and microwave power at 1%, 50 Torr, 500 °C, and 1100 W, respectively. Two samples with different doping were prepared 2000 ppm and 7000 [B/C] in the gas phase. SEM and AFM analyses revealed the presence of well-developed grains with an average size of 100 nm. The epitaxial GaN substrate-induced preferential formation of (111)-facetted diamond was revealed by AFM and XRD. After the deposition process, the signal of the GaN substrate is still visible in Raman spectroscopy (showing three main GaN bands located at 565, 640 and 735 cm(−1)) as well as in typical XRD patterns. Analysis of the current–voltage characteristics as a function of temperature yielded activation energy equal to 93.8 meV. MDPI 2021-10-23 /pmc/articles/PMC8585340/ /pubmed/34771852 http://dx.doi.org/10.3390/ma14216328 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Sobaszek, Michał Gnyba, Marcin Kulesza, Sławomir Bramowicz, Mirosław Klimczuk, Tomasz Bogdanowicz, Robert Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title | Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title_full | Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title_fullStr | Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title_full_unstemmed | Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title_short | Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title_sort | boron-doped diamond/gan heterojunction—the influence of the low-temperature deposition |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8585340/ https://www.ncbi.nlm.nih.gov/pubmed/34771852 http://dx.doi.org/10.3390/ma14216328 |
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