Cargando…
Data Augmentation of Backscatter X-ray Images for Deep Learning-Based Automatic Cargo Inspection
Custom inspection using X-ray imaging is a very promising application of modern pattern recognition technology. However, the lack of data or renewal of tariff items makes the application of such technology difficult. In this paper, we present a data augmentation technique based on a new image-to-ima...
| Autores principales: | , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8587046/ https://www.ncbi.nlm.nih.gov/pubmed/34770600 http://dx.doi.org/10.3390/s21217294 |