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Data Augmentation of Backscatter X-ray Images for Deep Learning-Based Automatic Cargo Inspection

Custom inspection using X-ray imaging is a very promising application of modern pattern recognition technology. However, the lack of data or renewal of tariff items makes the application of such technology difficult. In this paper, we present a data augmentation technique based on a new image-to-ima...

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Detalles Bibliográficos
Autores principales:	Cho, Hyunwoo, Park, Haesol, Kim, Ig-Jae, Cho, Junghyun
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2021
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8587046/ https://www.ncbi.nlm.nih.gov/pubmed/34770600 http://dx.doi.org/10.3390/s21217294

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