Chip Appearance Defect Recognition Based on Convolutional Neural Network

To improve the recognition rate of chip appearance defects, an algorithm based on a convolution neural network is proposed to identify chip appearance defects of various shapes and features. Furthermore, to address the problems of long training time and low accuracy caused by redundant input samples...

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Detalles Bibliográficos
Autores principales: Wang, Jun, Zhou, Xiaomeng, Wu, Jingjing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8588514/
https://www.ncbi.nlm.nih.gov/pubmed/34770383
http://dx.doi.org/10.3390/s21217076

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8588514/
https://www.ncbi.nlm.nih.gov/pubmed/34770383
http://dx.doi.org/10.3390/s21217076

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