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Chip Appearance Defect Recognition Based on Convolutional Neural Network
To improve the recognition rate of chip appearance defects, an algorithm based on a convolution neural network is proposed to identify chip appearance defects of various shapes and features. Furthermore, to address the problems of long training time and low accuracy caused by redundant input samples...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8588514/ https://www.ncbi.nlm.nih.gov/pubmed/34770383 http://dx.doi.org/10.3390/s21217076 |