Relationship between diffraction peak, network topology, and amorphous-forming ability in silicon and silica

The network topology in disordered materials is an important structural descriptor for understanding the nature of disorder that is usually hidden in pairwise correlations. Here, we compare the covalent network topology of liquid and solidified silicon (Si) with that of silica (SiO(2)) on the basis...

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Detalles Bibliográficos
Autores principales: Kohara, Shinji, Shiga, Motoki, Onodera, Yohei, Masai, Hirokazu, Hirata, Akihiko, Murakami, Motohiko, Morishita, Tetsuya, Kimura, Koji, Hayashi, Kouichi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8590056/
https://www.ncbi.nlm.nih.gov/pubmed/34772967
http://dx.doi.org/10.1038/s41598-021-00965-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8590056/
https://www.ncbi.nlm.nih.gov/pubmed/34772967
http://dx.doi.org/10.1038/s41598-021-00965-5

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