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Advanced Atomic Layer Deposition Technologies for Micro-LEDs and VCSELs

In recent years, the process requirements of nano-devices have led to the gradual reduction in the scale of semiconductor devices, and the consequent non-negligible sidewall defects caused by etching. Since plasma-enhanced chemical vapor deposition can no longer provide sufficient step coverage, the...

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Autores principales: Yeh, Yen-Wei, Lin, Su-Hui, Hsu, Tsung-Chi, Lai, Shouqiang, Lee, Po-Tsung, Lien, Shui-Yang, Wuu, Dong-Sing, Li, Guisen, Chen, Zhong, Wu, Tingzhu, Kuo, Hao-Chung
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8602599/
https://www.ncbi.nlm.nih.gov/pubmed/34792678
http://dx.doi.org/10.1186/s11671-021-03623-x
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author Yeh, Yen-Wei
Lin, Su-Hui
Hsu, Tsung-Chi
Lai, Shouqiang
Lee, Po-Tsung
Lien, Shui-Yang
Wuu, Dong-Sing
Li, Guisen
Chen, Zhong
Wu, Tingzhu
Kuo, Hao-Chung
author_facet Yeh, Yen-Wei
Lin, Su-Hui
Hsu, Tsung-Chi
Lai, Shouqiang
Lee, Po-Tsung
Lien, Shui-Yang
Wuu, Dong-Sing
Li, Guisen
Chen, Zhong
Wu, Tingzhu
Kuo, Hao-Chung
author_sort Yeh, Yen-Wei
collection PubMed
description In recent years, the process requirements of nano-devices have led to the gradual reduction in the scale of semiconductor devices, and the consequent non-negligible sidewall defects caused by etching. Since plasma-enhanced chemical vapor deposition can no longer provide sufficient step coverage, the characteristics of atomic layer deposition ALD technology are used to solve this problem. ALD utilizes self-limiting interactions between the precursor gas and the substrate surface. When the reactive gas forms a single layer of chemical adsorbed on the substrate surface, no reaction occurs between them and the growth thickness can be controlled. At the Å level, it can provide good step coverage. In this study, recent research on the ALD passivation on micro-light-emitting diodes and vertical cavity surface emitting lasers was reviewed and compared. Several passivation methods were demonstrated to lead to enhanced light efficiency, reduced leakage, and improved reliability.
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spelling pubmed-86025992021-12-02 Advanced Atomic Layer Deposition Technologies for Micro-LEDs and VCSELs Yeh, Yen-Wei Lin, Su-Hui Hsu, Tsung-Chi Lai, Shouqiang Lee, Po-Tsung Lien, Shui-Yang Wuu, Dong-Sing Li, Guisen Chen, Zhong Wu, Tingzhu Kuo, Hao-Chung Nanoscale Res Lett Nano Review In recent years, the process requirements of nano-devices have led to the gradual reduction in the scale of semiconductor devices, and the consequent non-negligible sidewall defects caused by etching. Since plasma-enhanced chemical vapor deposition can no longer provide sufficient step coverage, the characteristics of atomic layer deposition ALD technology are used to solve this problem. ALD utilizes self-limiting interactions between the precursor gas and the substrate surface. When the reactive gas forms a single layer of chemical adsorbed on the substrate surface, no reaction occurs between them and the growth thickness can be controlled. At the Å level, it can provide good step coverage. In this study, recent research on the ALD passivation on micro-light-emitting diodes and vertical cavity surface emitting lasers was reviewed and compared. Several passivation methods were demonstrated to lead to enhanced light efficiency, reduced leakage, and improved reliability. Springer US 2021-11-18 /pmc/articles/PMC8602599/ /pubmed/34792678 http://dx.doi.org/10.1186/s11671-021-03623-x Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Nano Review
Yeh, Yen-Wei
Lin, Su-Hui
Hsu, Tsung-Chi
Lai, Shouqiang
Lee, Po-Tsung
Lien, Shui-Yang
Wuu, Dong-Sing
Li, Guisen
Chen, Zhong
Wu, Tingzhu
Kuo, Hao-Chung
Advanced Atomic Layer Deposition Technologies for Micro-LEDs and VCSELs
title Advanced Atomic Layer Deposition Technologies for Micro-LEDs and VCSELs
title_full Advanced Atomic Layer Deposition Technologies for Micro-LEDs and VCSELs
title_fullStr Advanced Atomic Layer Deposition Technologies for Micro-LEDs and VCSELs
title_full_unstemmed Advanced Atomic Layer Deposition Technologies for Micro-LEDs and VCSELs
title_short Advanced Atomic Layer Deposition Technologies for Micro-LEDs and VCSELs
title_sort advanced atomic layer deposition technologies for micro-leds and vcsels
topic Nano Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8602599/
https://www.ncbi.nlm.nih.gov/pubmed/34792678
http://dx.doi.org/10.1186/s11671-021-03623-x
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