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Current Rectification and Photo-Responsive Current Achieved through Interfacial Facet Control of Cu(2)O–Si Wafer Heterojunctions
[Image: see text] Conductive atomic force microscopy (C-AFM) was employed to perform conductivity measurements on a facet-specific Cu(2)O cube, octahedron, and rhombic dodecahedron and intrinsic Si {100}, {111}, and {110} wafers. Similar I–V curves to those recorded previously using a nanomanipulato...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2021
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8614108/ https://www.ncbi.nlm.nih.gov/pubmed/34841063 http://dx.doi.org/10.1021/acscentsci.1c01067 |