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Multilayer Reflective Coatings for BEUV Lithography: A Review
The development of microelectronics is always driven by reducing transistor size and increasing integration, from the initial micron-scale to the current few nanometers. The photolithography technique for manufacturing the transistor needs to reduce the wavelength of the optical wave, from ultraviol...
Autores principales: | Uzoma, Paul C., Shabbir, Salman, Hu, Huan, Okonkwo, Paul C., Penkov, Oleksiy V. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8620789/ https://www.ncbi.nlm.nih.gov/pubmed/34835544 http://dx.doi.org/10.3390/nano11112782 |
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