Erratum: Zhu, Y.; Pal, J. Low-Voltage and High-Reliability RF MEMS Switch with Combined Electrothermal and Electrostatic Actuation. Micromachines 2021, 12, 1237

Detalles Bibliográficos
Autores principales: Zhu, Yong, Pal, Jitendra
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Erratum
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8622827/
https://www.ncbi.nlm.nih.gov/pubmed/34832845
http://dx.doi.org/10.3390/mi12111389

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8622827/
https://www.ncbi.nlm.nih.gov/pubmed/34832845
http://dx.doi.org/10.3390/mi12111389

Ejemplares similares