Cargando…
Tin Whiskers’ Behavior under Stress Load and the Mitigation Method for Immersion Tin Surface Finish
Since the use of the most stable Pb-based materials in the electronic industry has been banned due to human health concerns, numerous research studies have focused on Pb-free materials such as pure tin and its alloys for electronic applications. Pure tin, however, suffers from tin whiskers’ formatio...
Autores principales: | Fadil, Nor Akmal, Yusof, Siti Zahira, Abu Bakar, Tuty Asma, Ghazali, Habibah, Mat Yajid, Muhamad Azizi, Osman, Saliza Azlina, Ourdjini, Ali |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8623119/ https://www.ncbi.nlm.nih.gov/pubmed/34832218 http://dx.doi.org/10.3390/ma14226817 |
Ejemplares similares
-
Mitigating tin whisker risks: theory and practice
por: Kato, Takahiko, et al.
Publicado: (2016) -
A Review of Transition Metal Sulfides as Counter Electrodes for Dye-Sensitized and Quantum Dot-Sensitized Solar Cells
por: Kharboot, Layla Haythoor, et al.
Publicado: (2023) -
Tin tin : the complete companion /
por: Farr, Michael -
Tin
por: Thompson, J. R.
Publicado: (1894) -
Experimental Study on Tin Slag Polymer Concrete Strengthening under Compression with Metallic Material Confinement
por: Manda, Muhamad Soffi, et al.
Publicado: (2023)