A macro-nano-atomic–scale high-throughput approach for material research

Understanding the properties of materials requires structural characterization over large areas and different scales to link microstructure with performance. Here, we demonstrate a single-beam high-throughput scanning electron microscope allowing the collection of both secondary electron and backsca...

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Detalles Bibliográficos
Autores principales: Ju, Yiwei, Li, Shuai, Yuan, Xiaofei, Cui, Lei, Godfrey, Andy, Yan, Yunjie, Cheng, Zhiying, Zhong, Xiaoyan, Zhu, Jing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Association for the Advancement of Science 2021
Materias:
Physical and Materials Sciences
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8635436/
https://www.ncbi.nlm.nih.gov/pubmed/34851676
http://dx.doi.org/10.1126/sciadv.abj8804

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8635436/
https://www.ncbi.nlm.nih.gov/pubmed/34851676
http://dx.doi.org/10.1126/sciadv.abj8804

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