Influence of the Microstructure and Optical Constants on Plasmonic Properties of Copper Nanolayers

Copper layers with thicknesses of 12, 25, and 35 nm were thermally evaporated on silicon substrates (Si [Formula: see text]) with two different deposition rates 0.5 and 5.0 Å/s. The microstructure of produced coatings was studied using atomic force microscopy (AFM) and powder X-ray diffractometer (X...

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Detalles Bibliográficos
Autores principales: Rerek, Tomasz, Derkowska-Zielinska, Beata, Trzcinski, Marek, Szczesny, Robert, Naparty, Mieczyslaw K., Skowronski, Lukasz
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8658243/
https://www.ncbi.nlm.nih.gov/pubmed/34885447
http://dx.doi.org/10.3390/ma14237292

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8658243/
https://www.ncbi.nlm.nih.gov/pubmed/34885447
http://dx.doi.org/10.3390/ma14237292

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