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Influence of the Microstructure and Optical Constants on Plasmonic Properties of Copper Nanolayers
Copper layers with thicknesses of 12, 25, and 35 nm were thermally evaporated on silicon substrates (Si [Formula: see text]) with two different deposition rates 0.5 and 5.0 Å/s. The microstructure of produced coatings was studied using atomic force microscopy (AFM) and powder X-ray diffractometer (X...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8658243/ https://www.ncbi.nlm.nih.gov/pubmed/34885447 http://dx.doi.org/10.3390/ma14237292 |