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Visual Attention and Color Cues for 6D Pose Estimation on Occluded Scenarios Using RGB-D Data

Recently, 6D pose estimation methods have shown robust performance on highly cluttered scenes and different illumination conditions. However, occlusions are still challenging, with recognition rates decreasing to less than 10% for half-visible objects in some datasets. In this paper, we propose to u...

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Detalles Bibliográficos
Autores principales: Vidal, Joel, Lin, Chyi-Yeu, Martí, Robert
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8662424/
https://www.ncbi.nlm.nih.gov/pubmed/34884094
http://dx.doi.org/10.3390/s21238090
Descripción
Sumario:Recently, 6D pose estimation methods have shown robust performance on highly cluttered scenes and different illumination conditions. However, occlusions are still challenging, with recognition rates decreasing to less than 10% for half-visible objects in some datasets. In this paper, we propose to use top-down visual attention and color cues to boost performance of a state-of-the-art method on occluded scenarios. More specifically, color information is employed to detect potential points in the scene, improve feature-matching, and compute more precise fitting scores. The proposed method is evaluated on the Linemod occluded (LM-O), TUD light (TUD-L), Tejani (IC-MI) and Doumanoglou (IC-BIN) datasets, as part of the SiSo BOP benchmark, which includes challenging highly occluded cases, illumination changing scenarios, and multiple instances. The method is analyzed and discussed for different parameters, color spaces and metrics. The presented results show the validity of the proposed approach and their robustness against illumination changes and multiple instance scenarios, specially boosting the performance on relatively high occluded cases. The proposed solution provides an absolute improvement of up to 30% for levels of occlusion between 40% to 50%, outperforming other approaches with a best overall recall of 71% for the LM-O, 92% for TUD-L, 99.3% for IC-MI and 97.5% for IC-BIN.