Measurements of transepithelial electrical resistance (TEER) are affected by junctional length in immature epithelial monolayers

The measurement of transepithelial electrical resistance (TEER) is a common technique to determine the barrier integrity of epithelial cell monolayers. However, it is remarkable that absolute TEER values of similar cell types cultured under comparable conditions show an immense heterogeneity. Based...

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Detalles Bibliográficos
Autores principales: Felix, Kannapin, Tobias, Schmitz, Jan, Hansmann, Nicolas, Schlegel, Michael, Meir
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer Berlin Heidelberg 2021
Materias:
Short Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8695537/
https://www.ncbi.nlm.nih.gov/pubmed/34459960
http://dx.doi.org/10.1007/s00418-021-02026-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8695537/
https://www.ncbi.nlm.nih.gov/pubmed/34459960
http://dx.doi.org/10.1007/s00418-021-02026-4

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