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AlN PEALD with TMA and forming gas: study of plasma reaction mechanisms

The effect of deposition temperature and plasma dose on plasma-enhanced atomic layer deposition (PEALD) of AlN thin films with forming gas plasma and trimethylaluminum (TMA) has been studied. The temperature has a strong effect on TMA absorption considering the d-TMA absorptions at low deposition te...

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Detalles Bibliográficos
Autores principales: Miao, Mengmeng, Cadien, Ken
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society of Chemistry 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8697165/
https://www.ncbi.nlm.nih.gov/pubmed/35423742
http://dx.doi.org/10.1039/d0ra05134a