Ten Years Progress of Electrical Detection of Heavy Metal Ions (HMIs) Using Various Field-Effect Transistor (FET) Nanosensors: A Review

Heavy metal pollution remains a major concern for the public today, in line with the growing population and global industrialization. Heavy metal ion (HMI) is a threat to human and environmental safety, even at low concentrations, thus rapid and continuous HMI monitoring is essential. Among the sens...

Descripción completa

Detalles Bibliográficos
Autores principales: Falina, Shaili, Syamsul, Mohd, Rhaffor, Nuha Abd, Sal Hamid, Sofiyah, Mohamed Zain, Khairu Anuar, Abd Manaf, Asrulnizam, Kawarada, Hiroshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8699440/
https://www.ncbi.nlm.nih.gov/pubmed/34940235
http://dx.doi.org/10.3390/bios11120478

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8699440/
https://www.ncbi.nlm.nih.gov/pubmed/34940235
http://dx.doi.org/10.3390/bios11120478

Ejemplares similares