The Fingerprints of Resonant Frequency for Atomic Vacancy Defect Identification in Graphene

The identification of atomic vacancy defects in graphene is an important and challenging issue, which involves inhomogeneous spatial randomness and requires high experimental conditions. In this paper, the fingerprints of resonant frequency for atomic vacancy defect identification are provided, base...

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Detalles Bibliográficos
Autores principales: Chu, Liu, Shi, Jiajia, Souza de Cursi, Eduardo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8705047/
https://www.ncbi.nlm.nih.gov/pubmed/34947801
http://dx.doi.org/10.3390/nano11123451

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8705047/
https://www.ncbi.nlm.nih.gov/pubmed/34947801
http://dx.doi.org/10.3390/nano11123451

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