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OBET: On-the-Fly Byte-Level Error Tracking for Correcting and Detecting Faults in Unreliable DRAM Systems
With technology scaling, maintaining the reliability of dynamic random-access memory (DRAM) has become more challenging. Therefore, on-die error correction codes have been introduced to accommodate reliability issues in DDR5. However, the current solution still suffers from high overhead when a larg...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8708231/ https://www.ncbi.nlm.nih.gov/pubmed/34960359 http://dx.doi.org/10.3390/s21248271 |