Cargando…
Doping Profiles in Ultrathin Vertical VLS-Grown InAs Nanowire MOSFETs with High Performance
[Image: see text] Thin vertical nanowires based on III–V compound semiconductors are viable candidates as channel material in metal oxide semiconductor field effect transistors (MOSFETs) due to attractive carrier transport properties. However, for improved performance in terms of current density as...
Autores principales: | Jönsson, Adam, Svensson, Johannes, Fiordaliso, Elisabetta Maria, Lind, Erik, Hellenbrand, Markus, Wernersson, Lars-Erik |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2021
|
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8717821/ https://www.ncbi.nlm.nih.gov/pubmed/34988463 http://dx.doi.org/10.1021/acsaelm.1c00729 |
Ejemplares similares
-
Improved Electrostatics through Digital Etch Schemes
in Vertical GaSb Nanowire p-MOSFETs on Si
por: Zhu, Zhongyunshen, et al.
Publicado: (2022) -
Origin of Anomalous Piezoresistive Effects in VLS
Grown Si Nanowires
por: Winkler, Karl, et al.
Publicado: (2015) -
Integration of VLS-Grown WO(3) Nanowires
into Sensing Devices for the Detection of H(2)S and O(3)
por: Kaur, Navpreet, et al.
Publicado: (2019) -
Effects
of Interface Oxidation on Noise Properties
and Performance in III–V Vertical Nanowire Memristors
por: Saketh Ram, Mamidala, et al.
Publicado: (2023) -
Three-Dimensional
Integration of InAs Nanowires by
Template-Assisted Selective Epitaxy on Tungsten
por: Svensson, Johannes, et al.
Publicado: (2023)