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A review on modern defect detection models using DCNNs – Deep convolutional neural networks()
BACKGROUND: Over the last years Deep Learning has shown to yield remarkable results when compared to traditional computer vision algorithms, in a large variety of computer vision applications. The deeplearning models outperformed in both accuracy and processing time. Thus, once a deeplearning models...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Elsevier
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8721352/ https://www.ncbi.nlm.nih.gov/pubmed/35024194 http://dx.doi.org/10.1016/j.jare.2021.03.015 |