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A review on modern defect detection models using DCNNs – Deep convolutional neural networks()

BACKGROUND: Over the last years Deep Learning has shown to yield remarkable results when compared to traditional computer vision algorithms, in a large variety of computer vision applications. The deeplearning models outperformed in both accuracy and processing time. Thus, once a deeplearning models...

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Autores principales: Tulbure, Andrei-Alexandru, Tulbure, Adrian-Alexandru, Dulf, Eva-Henrietta
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8721352/
https://www.ncbi.nlm.nih.gov/pubmed/35024194
http://dx.doi.org/10.1016/j.jare.2021.03.015
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author Tulbure, Andrei-Alexandru
Tulbure, Adrian-Alexandru
Dulf, Eva-Henrietta
author_facet Tulbure, Andrei-Alexandru
Tulbure, Adrian-Alexandru
Dulf, Eva-Henrietta
author_sort Tulbure, Andrei-Alexandru
collection PubMed
description BACKGROUND: Over the last years Deep Learning has shown to yield remarkable results when compared to traditional computer vision algorithms, in a large variety of computer vision applications. The deeplearning models outperformed in both accuracy and processing time. Thus, once a deeplearning models won the Image Net Large Scale Visual Recognition Contest, it proved that this area of research is of great potential. Furthermore, these increases in recognition performance resulted in more applied research and thus, more applications where deeplearning is useful: one of which is defect detection (or visual defect detection). In the last few years, deeplearning models achieved higher and higher accuracy on the complex testing datasets used for benchmarking. This surge in accuracy and usage is also supported (besides swarms of researchers pouring into the race), by incremental breakthroughs in computing hardware: such as more powerful GPUs(Graphical processing units), CPUs(central processing units) and better computing procedures (libraries and frameworks). AIM OF THE REVIEW: To offer a structured and analytical overview(stating both advantages and disadvantages) of the existing popular object detection models that can be re-purposed for defect detection: such as Region based CNNs(Convolutional neural networks), YOLO(You only look once), SSD(single shot detectors) and cascaded architectures. A further brief summary on model compression and acceleration techniques that enabled the portability of deeplearning detection models is included. KEY SCIENTIFIC CONCEPTS OF REVIEW: It is of great use for future developments in the manufacturing industry that many of the popular, above mentioned models are easy to re-purpose for defect detection and, thus could really contribute to the overall increase in productivity of this sector. Moreover, in the experiment performed the YOLOv4 model was trained and re-purposed for industrial cable detection in several hours. The computing needs could be fulfilled by a general purpose computer or by a high-performance desktop setup, depending on the specificity of the application. Hence, the barrier of computing shall be somewhat easier to climb for all types of businesses.
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spelling pubmed-87213522022-01-11 A review on modern defect detection models using DCNNs – Deep convolutional neural networks() Tulbure, Andrei-Alexandru Tulbure, Adrian-Alexandru Dulf, Eva-Henrietta J Adv Res Mathematics, Engineering, and Computer Science BACKGROUND: Over the last years Deep Learning has shown to yield remarkable results when compared to traditional computer vision algorithms, in a large variety of computer vision applications. The deeplearning models outperformed in both accuracy and processing time. Thus, once a deeplearning models won the Image Net Large Scale Visual Recognition Contest, it proved that this area of research is of great potential. Furthermore, these increases in recognition performance resulted in more applied research and thus, more applications where deeplearning is useful: one of which is defect detection (or visual defect detection). In the last few years, deeplearning models achieved higher and higher accuracy on the complex testing datasets used for benchmarking. This surge in accuracy and usage is also supported (besides swarms of researchers pouring into the race), by incremental breakthroughs in computing hardware: such as more powerful GPUs(Graphical processing units), CPUs(central processing units) and better computing procedures (libraries and frameworks). AIM OF THE REVIEW: To offer a structured and analytical overview(stating both advantages and disadvantages) of the existing popular object detection models that can be re-purposed for defect detection: such as Region based CNNs(Convolutional neural networks), YOLO(You only look once), SSD(single shot detectors) and cascaded architectures. A further brief summary on model compression and acceleration techniques that enabled the portability of deeplearning detection models is included. KEY SCIENTIFIC CONCEPTS OF REVIEW: It is of great use for future developments in the manufacturing industry that many of the popular, above mentioned models are easy to re-purpose for defect detection and, thus could really contribute to the overall increase in productivity of this sector. Moreover, in the experiment performed the YOLOv4 model was trained and re-purposed for industrial cable detection in several hours. The computing needs could be fulfilled by a general purpose computer or by a high-performance desktop setup, depending on the specificity of the application. Hence, the barrier of computing shall be somewhat easier to climb for all types of businesses. Elsevier 2021-04-23 /pmc/articles/PMC8721352/ /pubmed/35024194 http://dx.doi.org/10.1016/j.jare.2021.03.015 Text en © 2021 The Authors. Published by Elsevier B.V. on behalf of Cairo University. https://creativecommons.org/licenses/by-nc-nd/4.0/This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
spellingShingle Mathematics, Engineering, and Computer Science
Tulbure, Andrei-Alexandru
Tulbure, Adrian-Alexandru
Dulf, Eva-Henrietta
A review on modern defect detection models using DCNNs – Deep convolutional neural networks()
title A review on modern defect detection models using DCNNs – Deep convolutional neural networks()
title_full A review on modern defect detection models using DCNNs – Deep convolutional neural networks()
title_fullStr A review on modern defect detection models using DCNNs – Deep convolutional neural networks()
title_full_unstemmed A review on modern defect detection models using DCNNs – Deep convolutional neural networks()
title_short A review on modern defect detection models using DCNNs – Deep convolutional neural networks()
title_sort review on modern defect detection models using dcnns – deep convolutional neural networks()
topic Mathematics, Engineering, and Computer Science
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8721352/
https://www.ncbi.nlm.nih.gov/pubmed/35024194
http://dx.doi.org/10.1016/j.jare.2021.03.015
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