BraggNN: fast X-ray Bragg peak analysis using deep learning

X-ray diffraction based microscopy techniques such as high-energy diffraction microscopy (HEDM) rely on knowledge of the position of diffraction peaks with high precision. These positions are typically computed by fitting the observed intensities in detector data to a theoretical peak shape such as...

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Detalles Bibliográficos
Autores principales: Liu, Zhengchun, Sharma, Hemant, Park, Jun-Sang, Kenesei, Peter, Miceli, Antonino, Almer, Jonathan, Kettimuthu, Rajkumar, Foster, Ian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8733885/
https://www.ncbi.nlm.nih.gov/pubmed/35059215
http://dx.doi.org/10.1107/S2052252521011258

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8733885/
https://www.ncbi.nlm.nih.gov/pubmed/35059215
http://dx.doi.org/10.1107/S2052252521011258

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