Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector

The latest Complementary Metal Oxide Semiconductor (CMOS) 2D sensors now rival the performance of state-of-the-art photon detectors for optical application, combining a high-frame-rate speed with a wide dynamic range. While the advent of high-repetition-rate hard X-ray free-electron lasers (FELs) ha...

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Detalles Bibliográficos
Autores principales: Léveillé, Cyril, Desjardins, Kewin, Popescu, Horia, Vondungbo, Boris, Hennes, Marcel, Delaunay, Renaud, Jal, Emmanuelle, De Angelis, Dario, Pancaldi, Matteo, Pedersoli, Emanuele, Capotondi, Flavio, Jaouen, Nicolas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8733974/
https://www.ncbi.nlm.nih.gov/pubmed/34985427
http://dx.doi.org/10.1107/S1600577521012303

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8733974/
https://www.ncbi.nlm.nih.gov/pubmed/34985427
http://dx.doi.org/10.1107/S1600577521012303

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