Characterizing the Chemical Structure of Ti(3)C(2)T(x) MXene by Angle-Resolved XPS Combined with Argon Ion Etching

Angle-resolved XPS combined with argon ion etching was used to characterize the surface functional groups and the chemical structure of Ti(3)C(2)T(x) MXene. Survey scanning obtained on the sample surface showed that the sample mainly contains C, O, Ti and F elements, and a little Al element. Analyzi...

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Detalles Bibliográficos
Autores principales: Lu, Yangfan, Li, Dongsheng, Liu, Fu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8745820/
https://www.ncbi.nlm.nih.gov/pubmed/35009453
http://dx.doi.org/10.3390/ma15010307

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8745820/
https://www.ncbi.nlm.nih.gov/pubmed/35009453
http://dx.doi.org/10.3390/ma15010307

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