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Characterizing the Chemical Structure of Ti(3)C(2)T(x) MXene by Angle-Resolved XPS Combined with Argon Ion Etching
Angle-resolved XPS combined with argon ion etching was used to characterize the surface functional groups and the chemical structure of Ti(3)C(2)T(x) MXene. Survey scanning obtained on the sample surface showed that the sample mainly contains C, O, Ti and F elements, and a little Al element. Analyzi...
Autores principales: | Lu, Yangfan, Li, Dongsheng, Liu, Fu |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8745820/ https://www.ncbi.nlm.nih.gov/pubmed/35009453 http://dx.doi.org/10.3390/ma15010307 |
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