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Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors
The segmented semiconductor detectors for transmitted electrons in ultrahigh resolution scanning electron microscopes allow observing samples in various imaging modes. Typically, two standard modes of objective lens, with and without a magnetic field, differ by their resolution. If the beam decelera...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8746443/ https://www.ncbi.nlm.nih.gov/pubmed/35010021 http://dx.doi.org/10.3390/nano12010071 |