Sensitive Metal-Semiconductor Nanothermocouple Fabricated by FIB to Investigate Laser Beams with Nanometer Spatial Resolution

The focused ion beam (FIB) technique was used to fabricate a nanothermocouple (with a 90 nm wide nanojunction) based on a metal–semiconductor (Pt–Si) structure, which showed a sensitivity up to 10 times larger (with Seebeck coefficient up to 140 µV/K) than typical metal–metal nanothermocouples. In c...

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Detalles Bibliográficos
Autores principales: Łaszcz, Adam, Czerwinski, Andrzej, Pruszyńska-Karbownik, Emilia, Wzorek, Marek, Szmigiel, Dariusz
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8749706/
https://www.ncbi.nlm.nih.gov/pubmed/35009829
http://dx.doi.org/10.3390/s22010287

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8749706/
https://www.ncbi.nlm.nih.gov/pubmed/35009829
http://dx.doi.org/10.3390/s22010287

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