Intelligent Fault Diagnosis Framework for Modular Multilevel Converters in HVDC Transmission

Open circuit failure mode in insulated-gate bipolar transistors (IGBT) is one of the most common faults in modular multilevel converters (MMCs). Several techniques for MMC fault diagnosis based on threshold parameters have been proposed, but very few studies have considered artificial intelligence (...

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Detalles Bibliográficos
Autores principales: Ahmed, Hosameldin O. A., Yu, Yuexiao, Wang, Qinghua, Darwish, Mohamed, Nandi, Asoke K.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8749776/
https://www.ncbi.nlm.nih.gov/pubmed/35009901
http://dx.doi.org/10.3390/s22010362

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8749776/
https://www.ncbi.nlm.nih.gov/pubmed/35009901
http://dx.doi.org/10.3390/s22010362

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