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Intelligent Fault Diagnosis Framework for Modular Multilevel Converters in HVDC Transmission
Open circuit failure mode in insulated-gate bipolar transistors (IGBT) is one of the most common faults in modular multilevel converters (MMCs). Several techniques for MMC fault diagnosis based on threshold parameters have been proposed, but very few studies have considered artificial intelligence (...
Autores principales: | Ahmed, Hosameldin O. A., Yu, Yuexiao, Wang, Qinghua, Darwish, Mohamed, Nandi, Asoke K. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8749776/ https://www.ncbi.nlm.nih.gov/pubmed/35009901 http://dx.doi.org/10.3390/s22010362 |
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