Control of the Longitudinal Compression and Transverse Focus of Ultrafast Electron Beam for Detecting the Transient Evolution of Materials

Ultrafast detection is an effective method to reveal the transient evolution mechanism of materials. Compared with ultra-fast X-ray diffraction (XRD), the ultra-fast electron beam is increasingly adopted because the larger scattering cross-section is less harmful to the sample. The keV single-shot u...

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Detalles Bibliográficos
Autores principales: Cai, Xintian, Wang, Zhen, Ji, Chaoyue, Wang, Xuan, Gan, Zhiyin, Liu, Sheng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8781741/
https://www.ncbi.nlm.nih.gov/pubmed/35057289
http://dx.doi.org/10.3390/ma15020571

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8781741/
https://www.ncbi.nlm.nih.gov/pubmed/35057289
http://dx.doi.org/10.3390/ma15020571

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