AI-based atomic force microscopy image analysis allows to predict electrochemical impedance spectra of defects in tethered bilayer membranes

Atomic force microscopy (AFM) image analysis of supported bilayers, such as tethered bilayer membranes (tBLMs) can reveal the nature of the membrane damage by pore-forming proteins and predict the electrochemical impedance spectroscopy (EIS) response of such objects. However, automated analysis invo...

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Detalles Bibliográficos
Autores principales: Raila, Tomas, Penkauskas, Tadas, Ambrulevičius, Filipas, Jankunec, Marija, Meškauskas, Tadas, Valinčius, Gintaras
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8783026/
https://www.ncbi.nlm.nih.gov/pubmed/35064137
http://dx.doi.org/10.1038/s41598-022-04853-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8783026/
https://www.ncbi.nlm.nih.gov/pubmed/35064137
http://dx.doi.org/10.1038/s41598-022-04853-4

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