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AI-based atomic force microscopy image analysis allows to predict electrochemical impedance spectra of defects in tethered bilayer membranes
Atomic force microscopy (AFM) image analysis of supported bilayers, such as tethered bilayer membranes (tBLMs) can reveal the nature of the membrane damage by pore-forming proteins and predict the electrochemical impedance spectroscopy (EIS) response of such objects. However, automated analysis invo...
Autores principales: | Raila, Tomas, Penkauskas, Tadas, Ambrulevičius, Filipas, Jankunec, Marija, Meškauskas, Tadas, Valinčius, Gintaras |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8783026/ https://www.ncbi.nlm.nih.gov/pubmed/35064137 http://dx.doi.org/10.1038/s41598-022-04853-4 |
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