Electrostatic Discovery Atomic Force Microscopy

[Image: see text] While offering high resolution atomic and electronic structure, scanning probe microscopy techniques have found greater challenges in providing reliable electrostatic characterization on the same scale. In this work, we offer electrostatic discovery atomic force microscopy, a machi...

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Detalles Bibliográficos
Autores principales: Oinonen, Niko, Xu, Chen, Alldritt, Benjamin, Canova, Filippo Federici, Urtev, Fedor, Cai, Shuning, Krejčí, Ondřej, Kannala, Juho, Liljeroth, Peter, Foster, Adam S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2021
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8793147/
https://www.ncbi.nlm.nih.gov/pubmed/34806866
http://dx.doi.org/10.1021/acsnano.1c06840

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8793147/
https://www.ncbi.nlm.nih.gov/pubmed/34806866
http://dx.doi.org/10.1021/acsnano.1c06840

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