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Electrostatic Discovery Atomic Force Microscopy
[Image: see text] While offering high resolution atomic and electronic structure, scanning probe microscopy techniques have found greater challenges in providing reliable electrostatic characterization on the same scale. In this work, we offer electrostatic discovery atomic force microscopy, a machi...
Autores principales: | Oinonen, Niko, Xu, Chen, Alldritt, Benjamin, Canova, Filippo Federici, Urtev, Fedor, Cai, Shuning, Krejčí, Ondřej, Kannala, Juho, Liljeroth, Peter, Foster, Adam S. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2021
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8793147/ https://www.ncbi.nlm.nih.gov/pubmed/34806866 http://dx.doi.org/10.1021/acsnano.1c06840 |
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