In Situ Coupling Applied Voltage and Synchrotron Radiation: Operando Characterization of Transistors

A compact voltage application setup has been developed for in situ electrical testing of organic field effect transistors in combination with X-ray scattering studies at a synchrotron beamlines. Challenges faced during real condition in-operando test of newly developed OFETs originated an idea of cr...

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Detalles Bibliográficos
Autores principales: Davydok, Anton, Luponosov, Yuriy N., Ponomarenko, Sergey A., Grigorian, Souren
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2022
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8811105/
https://www.ncbi.nlm.nih.gov/pubmed/35107638
http://dx.doi.org/10.1186/s11671-022-03662-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8811105/
https://www.ncbi.nlm.nih.gov/pubmed/35107638
http://dx.doi.org/10.1186/s11671-022-03662-y

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