Identification and Validation of Quantitative Trait Loci Mapping for Spike-Layer Uniformity in Wheat

Spike-layer uniformity (SLU), the consistency of the spike distribution in the vertical space, is an important trait. It directly affects the yield potential and appearance. Revealing the genetic basis of SLU will provide new insights into wheat improvement. To map the SLU-related quantitative trait...

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Detalles Bibliográficos
Autores principales: Zhou, Kunyu, Lin, Yu, Jiang, Xiaojun, Zhou, Wanlin, Wu, Fangkun, Li, Caixia, Wei, Yuming, Liu, Yaxi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8835109/
https://www.ncbi.nlm.nih.gov/pubmed/35162974
http://dx.doi.org/10.3390/ijms23031052

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8835109/
https://www.ncbi.nlm.nih.gov/pubmed/35162974
http://dx.doi.org/10.3390/ijms23031052

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