Problems with Evaluation of Micro-Pore Size in Silicon Carbide Using Synchrotron X-ray Phase Contrast Imaging

We report near- and far-field computer simulations of synchrotron X-ray phase-contrast images using a micropipe in a SiC crystal as a model system. Experimental images illustrate the theoretical results. The properties of nearly perfect single crystals of silicon carbide are strongly affected by μm-...

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Detalles Bibliográficos
Autores principales: Argunova, Tatiana S., Kohn, Victor G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8836550/
https://www.ncbi.nlm.nih.gov/pubmed/35160800
http://dx.doi.org/10.3390/ma15030856

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8836550/
https://www.ncbi.nlm.nih.gov/pubmed/35160800
http://dx.doi.org/10.3390/ma15030856

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