Cargando…
Status of Aluminum Oxide Gate Dielectric Technology for Insulated-Gate GaN-Based Devices
Insulated-gate GaN-based transistors can fulfill the emerging demands for the future generation of highly efficient electronics for high-frequency, high-power and high-temperature applications. However, in contrast to Si-based devices, the introduction of an insulator on (Al)GaN is complicated by th...
Autores principales: | Calzolaro, Anthony, Mikolajick, Thomas, Wachowiak, Andre |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8837061/ https://www.ncbi.nlm.nih.gov/pubmed/35160737 http://dx.doi.org/10.3390/ma15030791 |
Ejemplares similares
-
Normally-Off p-GaN Gated AlGaN/GaN MIS-HEMTs with ALD-Grown Al(2)O(3)/AlN Composite Gate Insulator
por: Chiu, Hsien-Chin, et al.
Publicado: (2021) -
AlGaN/GaN MISHEMTs with AlN gate dielectric grown by thermal ALD technique
por: Liu, Xiao-Yong, et al.
Publicado: (2015) -
Gate leakage current induced trapping in AlGaN/GaN Schottky-gate HFETs and MISHFETs
por: Liao, Wen-Chia, et al.
Publicado: (2014) -
Use of Bilayer Gate Insulator in GaN-on-Si Vertical Trench MOSFETs: Impact on Performance and Reliability
por: Mukherjee, Kalparupa, et al.
Publicado: (2020) -
Mechanisms of the Device Property Alteration Generated by the Proton Irradiation in GaN-Based MIS-HEMTs Using Extremely Thin Gate Insulator
por: Chang, Sung-Jae, et al.
Publicado: (2023)