STEM Tools for Semiconductor Characterization: Beyond High-Resolution Imaging

The smart engineering of novel semiconductor devices relies on the development of optimized functional materials suitable for the design of improved systems with advanced capabilities aside from better efficiencies. Thereby, the characterization of these materials at the highest level attainable is...

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Detalles Bibliográficos
Autores principales: de la Mata, María, Molina, Sergio I.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8840450/
https://www.ncbi.nlm.nih.gov/pubmed/35159686
http://dx.doi.org/10.3390/nano12030337

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8840450/
https://www.ncbi.nlm.nih.gov/pubmed/35159686
http://dx.doi.org/10.3390/nano12030337

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