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STEM Tools for Semiconductor Characterization: Beyond High-Resolution Imaging
The smart engineering of novel semiconductor devices relies on the development of optimized functional materials suitable for the design of improved systems with advanced capabilities aside from better efficiencies. Thereby, the characterization of these materials at the highest level attainable is...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8840450/ https://www.ncbi.nlm.nih.gov/pubmed/35159686 http://dx.doi.org/10.3390/nano12030337 |